[PDF.02hx] Data Mining and Diagnosing IC Fails (Frontiers in Electronic Testing)

Data Mining and Diagnosing IC Fails (Frontiers in Electronic Testing)

[PDF.ib55] Data Mining and Diagnosing IC Fails (Frontiers in Electronic Testing)

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 | #6398601 in Books |  Leendert M Huisman |  2005-06-21 | Original language:English | PDF # 1 |  9.21 x.63 x6.14l,1.27 | File type: PDF | 250 pages

 | Data Mining and Diagnosing IC Fails

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||From the Back Cover||Datamining and Diagnosing Integrated Circuit Fails addresses the problem of obtaining maximum information from (functional) Integrated Circuit fail data about the defects that caused the fails. It starts at the highest level from mere sort c

This book grew out of an attempt to describe a variety of tools that were developed over a period of years in IBM to analyze Integrated Circuit fail data. The selection presented in this book focuses on those tools that have a significant statistical or datamining component. The danger of describing sta­ tistical analysis methods is the amount of non-trivial mathematics that is involved and that tends to obscure the usually straigthforward analysis ideas. This book i...

You easily download any file type for your device.Data Mining and Diagnosing IC Fails (Frontiers in Electronic Testing)   |  Leendert M. Huisman. I have read it a couple of times and even shared with my family members. Really good. Couldnt put it down.

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